专利内容由知识产权出版社提供
专利名称：SAMPLE PROBABILITY OF FAULT FUNCTION
DETERMINATION USING CRITICAL DEFECTSIZE MAP
发明人：Robert J. Allen,Mervyn Y. Tan申请号：US10906549申请日：20050224
公开号：US20060190223A1公开日：20060824
专利附图：
摘要：Methods, systems and program products for determining a probability of fault(POF) function using critical defect size maps. Methods for an exact or a sample POF
function are provided. Critical area determinations can also be supplied based on theexact or sample POF functions. The invention provides a less computationally complexand storage-intensive methodology.
申请人：Robert J. Allen,Mervyn Y. Tan
地址：Jericho VT 05465 US,South Burlington VT 05403 US
国籍：US,US
更多信息请下载全文后查看
