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专利名称：Semiconductor integrated circuits发明人：小川 絢香,松尾 一心,稲津 賢治申请号：JP2018107726申请日：20180605公开号：JP2019211341A公开日：20191212
专利附图：
摘要：Problem to be solved: to provide a semiconductor integrated circuit in whichthe number of external terminals necessary for scan inspection is reduced by one. In thescan clock period definition state, the control circuit 6 defines the period information ofthe scan clock signal based on the data input from the outside to the inspection data
signal line 3 and the oscillation signal of the oscillator 5.In the shift in state, the scan clockgenerating circuit 7 generates the scan clock signal of the period information.ControlcircuitThe data input to the inspection data signal line 3 is sampled by the scan clocksignal.The scan input data signal is restored and controlled as a control data to thecombinational logic circuit 8A of the scan inspection circuit 8.In capture stateBased on thecontrol data, the scan clock signal is controlled to be acquired as a scan output datasignal at the rise or fall timing of the scan clock signal.In the shift out state, the scanoutput data signal is output to the outside.Diagram
申请人：株式会社デンソー
地址：愛知県刈谷市昭和町１丁目１番地
国籍：JP
代理人：特許業務法人 サトー国際特許事務所
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