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专利名称：High resolution positron emission
tomography
发明人：Farhad Taghibakhsh,Craig Steven Levin申请号：US13523293申请日：20120614公开号：US093971B2公开日：20150331
专利附图：
摘要：A method for extracting photon depth of interaction information in a positronemission tomography system is provided. A pulse is detected in a photodetector. Aheight of the pulse is measured. A determination of whether the pulse height is within a
set range is made. Photon depth of interaction is extracted from the pulse height. Anenergy of interaction is calculated from the pulse height and calibration data. Theextracted photon depth and calculated energy spectrum are used in imagereconstruction.
申请人：Farhad Taghibakhsh,Craig Steven Levin
地址：Redwood City CA US,Palo Alto CA US
国籍：US,US
代理机构：Beyer Law Group LLP
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