专利内容由知识产权出版社提供
专利名称：Microprocessor memory test circuit and
method
发明人：Gianluca Petrosino申请号：US08/5795申请日：19951227公开号：US056635A公开日：19971118
摘要：A circuit and method for testing on-chip memory for a microprocessor or amicrocomputer is disclosed. The memory test circuit includes an input register, an outputregister, an adder, and a sequencer to control the test process. The process includesreceiving a simple communication protocol from the control unit to start the test,running a common memory test such as a checker board, AAAAh, 5555h and the like, andthen storing the test results in an output register. The test circuit can include a bi-directional RESET signal means for disabling the system while the microprocessor ormicrocomputer runs its memory test.
申请人：SGS-THOMSON MICROELECTRONICS, INC.
代理人：George E. Clark,Theodore E. Galanthay,Lisa K. Jorgenson
更多信息请下载全文后查看
