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Battery testing device and battery testing method

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专利名称:Battery testing device and battery testing

method

发明人:Kanai, Takayuki c/o Intellectual Property

Department,Takeno, Kazuhiko c/o

Intellectual Property Department,Uemura,Haruo c/o Intellectual Property Department

申请号:EP08170869.5申请日:20081205公开号:EP2071659A3公开日:20091104

专利附图:

摘要:The present invention provides a battery testing device and a battery testingmethod which can appropriately verify the behavior of a battery when damage occurs.Appropriately verification of battery behavior in a case of battery damage has not beenachieved since a completely crushed state of a battery almost never occurs during thesue of a portable device, such as a portable telephone, and a completely crushed state ofa battery is not the worst condition when determining an abnormality induced by aninternal short. Therefore a secondary battery set on a test stand is partially crushedusing a pressing member, and the quality of the secondary battery is determined bymeasuring the temperature of the secondary battery, whereby battery behavior whenthe secondary battery is damaged can be appropriately verified.

申请人:NTT DoCoMo, Inc.

地址:11-1 Nagatacho 2-chome Chiyoda-ku Tokyo 100-6150 JP

国籍:JP

代理机构:Viering, Jentschura & Partner

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