METHOD AND APPARATUS FOR MEASURING PROPERTIES OF A

专利名称：METHOD AND APPARATUS FOR

MEASURING PROPERTIES OF A COMPOUND

发明人：LING JIAN MENG申请号：US12986160申请日：20110106

公开号：US20110188629A1公开日：20110804

专利附图：

摘要：A system that incorporates teachings of the present disclosure may include, forexample, an apparatus having a collimator having at least one aperture and afluorescence detector. The collimator can be positioned next to a compound. The

compound can emit fluorescence X-rays when impacted by an X-ray beam generated byan X-ray source. The collimator can absorb at least a first portion of the fluorescence X-rays emitted by the compound and release at least a second portion of the fluorescenceX-rays at the at least one aperture. The second portion of the fluorescence X-raysreleased by the at least one aperture have known directional information based on aposition of the collimator. The fluorescence detector can detect the second portion ofthe fluorescence X-rays released by the at least one aperture. A three-dimensional (3-D)rendering of an elemental distribution of the compound can be determined from thefluorescence X-rays detected and the directional information. Additional embodimentsare disclosed.

申请人：LING JIAN MENG

地址：CHAMPAIGN IL US

国籍：US

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