专利名称：Terminal of IC test fixture发明人：Teng Sheng Hung申请号：US10823702申请日：20040414
公开号：US20050231220A1公开日：20051020
专利附图：
摘要：A terminal of IC test fixture comprising a body, a spring contact arm and asoldering portion and there are at least one hollow holes on the body of the terminal.During testing, the electronic charges flow on the terminals generate electromagneticfield at the direction perpendicular to the electrical current flow, and the electronic
current flows, which are near, generates electromagnetic fields with different directions,by the compensation and interference of electromagnetic fields each other, making theelectromagnetic interference reduced. To suppress the electronic interference, theaforesaid hollow holes subdivide said electronic current flow, and that helps to constrainthe electromagnetic interference during testing. Therefore, this invention can minimizeelectromagnetic interference among terminals for higher efficiency in testing the highfrequency transmission IC's.
申请人：Teng Sheng Hung
地址：Taoyuan TW
国籍：TW
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