IC test equipment

专利名称：IC test equipment

发明人：Kempei Suzuki,Yushi Iwanaga,Hiroshi

Sato,Kohei Sato,Noriyuki Igarashi,ShinichiKoya

申请号：US06/747560申请日：19850621公开号：US04691831A公开日：19870908

摘要：An IC element supplied to a testing station is guided by a rail and a guidemember to move by its own weight. At least one of the rail and guide member has builttherein plate-shaped ceramic heater or plate- shaped silicone rubber heater. The guidemember urges the IC element against the rail to heat the IC element. An auxiliarystopper is provided opposite but aslant to the IC element sliding surface of the rail. TheIC element moving on the rail is yieldingly urged by the auxiliary stopper against thesliding surface of the rail, braked and engages an engaging piece at the lower end of theauxiliary stopper. The IC element is disengaged from the engaging piece to slightly moveand stopped by a main stopper, where the IC element is tested. A plurality of suchtesting passages are provided, and IC elements simultaneously tested in the testingpassage are fed to discharge rails respectively corresponding thereto. A plurality ofsorting rails are provided in a manner to be movable in the direction of arrangement ofthe discharge rails, and the spacing of the discharge rails and the spacing of the sortingrails are selected equal to each other so that the IC elements on the discharge rails aresimultaneously transferred to the sorting rails. The sorting rails move in a direction in

which a plurality of receiving passages of an unloader are arranged at intervals differentfrom those of the sorting rails. One of the sorting rails is selectively connected to one ofthe receiving passages according to the test results, feeding the IC element on the rail tothe unloader.

申请人：TAKEDA RIKEN CO., LTD.

代理机构：Staas & Halsey

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