专利名称：Measurement and Management Technology
Platform
发明人：Hendrik F. Hamann,Jon Lenchner,Andrew
Stepanchuk
申请号：US12540101申请日：20090812
公开号：US20110040392A1公开日：20110217
专利附图：
摘要：Techniques for implementing system best practices are provided. In one aspect,a method for monitoring, modeling and managing a physical system is provided. The
method includes the following steps. A physical data model of the physical system isprovided. Real time data is obtained from the physical system. The physical data model isupdated based on the real time data. An analytic model of the physical system is createdbased on the updated physical data model. Operation of the physical system iscontrolled based on output from the analytic model.
申请人：Hendrik F. Hamann,Jon Lenchner,Andrew Stepanchuk
地址：Yorktown Heights NY US,Hawthorne NY US,Wappingers Falls NY US
国籍：US,US,US
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