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专利名称：IC test equipment发明人：Yoshihito Kobayashi申请号：US07/7672申请日：19910930公开号：US05261775A公开日：19931116
摘要：In IC test equipment which has an input magazine support station forsupporting a magazine discharged from an input magazine stocker and an outputmagazine support station for supporting a magazine into which IC elements tested in atesting station are loaded, a magazine inverting device is provided between the inputmagazine stocker and the input magazine support station, for turning the magazinethrough 90 or 180 degrees about its lengthwise direction, an IC inverting device isprovided between the testing station and the output magazine support station, forturning an IC element through 90 or 180 degrees about the direction of its travel, and anIC diverter is provided whereby the orientation of the inverted IC relative to the directionof its travel is reversed and is then discharged into the magazine supported at the outputmagazine support station.
申请人：ADVANTEST CORPORATION
代理机构：Staas & Halsey
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