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专利名称：System and apparatus for testing packaged
devices and related methods
发明人：Daniel P. Cram申请号：US10743166申请日：20031222
公开号：US20050134299A1公开日：20050623
专利附图：
摘要：A testing system is disclosed for testing a packaged device having a body with apackage profile and an array of contacts coupled to the body. In one embodiment, thesystem includes a socket having a receiving area and an array of leads arranged to
engage the array of contacts on the packaged device. The system of this embodimentalso has a package handling assembly with a placement head and an alignment elementcoupled to the placement head. The alignment element is movable with the placementhead as a unit relative to the socket. The alignment element is positionable in thereceiving area of the socket. The alignment element restricts movement of the packageddevice in at least two dimensions relative to the array of leads when the packaged deviceis positioned in the receiving area adjacent to the array of leads.
申请人：Daniel P. Cram
地址：Boise ID US
国籍：US
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