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专利名称：Measuring apparatus and measuring
method
发明人：▲高▼須 良三申请号：JP2018013194申请日：20180130公开号：JP2019132628A公开日：20190808
专利附图：
摘要：A measuring apparatus and a measuring method capable of measuring a fineparticulate matter with high accuracy in a wide concentration range are provided. A firstcircuit 13 for individually detecting a fine particulate matter flowing from an intake port
11A to an exhaust port 11B in a measurement tank 11 and a second circuit 14 fordetecting a fine particle group of the fine particulate matter. A switch 12 that is switchedto one of a first state in which the output of the photodetector 24 is input to the firstcircuit 13 and a second state in which the output to the second circuit 14 is input; , And acontroller 16 that controls switching on and off of the light source 23 and switching ofthe state of the switch 12. The controller 16 turns on the light source 23 while driving thefan 22, and switches the switch 12 to the second state when the concentration of the fineparticulate matter calculated from the output of the first circuit is equal to or higher thanthe threshold value. Control is performed so that the switch 12 is switched to the firststate when the concentration of the fine particulate matter calculated from the output ofthe second circuit is less than the threshold value. [Selection] Figure 1
申请人：富士通株式会社
地址：神奈川県川崎市中原区上小田中４丁目１番１号
国籍：JP
代理人：伊東 忠重,伊東 忠彦
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